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Relax tolerance of `UnitaryOverlap` tests (#11069) (#11072) The failure rate for the parametric identity tests was about 0.2%, which at our CI scale corresponds to approximately one spurious failure every two days. The alternative to this is to fix the random seed of the test, but similar to other `quantum_info` tests, we would like some degree of extended coverage. Lifting the tolerance by three orders of magnitude at this circuit size should ensure a zero false-positive rate. This also changes the test to actually display the failure tolerance, so it's easier to tell from a CI run if a failure was real. (cherry picked from commit 80018cc14) Co-authored-by: Jake Lishman <jake.lishman@ibm.com>
73871 of 85005 relevant lines covered (86.9%)
91826.02 hits per line
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